Cestari, J.M.A.P., Loures, E.F.R., Santos, E.A.P., Panetto, H., 2019. A capability model for public administration interoperability. Enterprise Information Systems, v. 1, pp.1-31.
Ruschel, E., Santos, E.A.P., Loures, E.F.R., 2018. Establishment of maintenance inspection intervals: an application of process mining techniques in manufacturing. Journal of Intelligent Manufacturing, v. 1, pp.1.
Vieira, A.D., Santos, E.A.P., De Queiroz, M.H., Leal, A.B., De Paula Neto, A.D., Cury, J.E.R., 2017. A Method for PLC Implementation of Supervisory Control of Discrete Event Systems. IEEE Transactions on Control Systems Technology (Print), v. 25, pp.175-191.
Battirola Filho, J.C., Piechnicki, F., Loures, E.F.R., Santos, E.A.P., 2017. Process-aware FMEA framework for failure analysis in maintenance. Journal of Manufacturing technology Management, v. 28, pp.822-848.
Ruschel, E., Santos, E.A.P., Loures, E.A.P., 2017. Industrial maintenance decision-making: A systematic literature review. Journal of Manufacturing Systems, v. 45, pp.180-194.
Cestari, J.M.A.P., Loures, E.F.R., Santos, E.A.P., Panetto, H., 2019. A capability model for public administration interoperability. Enterprise Information Systems, v. 1, pp.1-31.
Ruschel, E., Santos, E.A.P., Loures, E.F.R., 2018. Establishment of maintenance inspection intervals: an application of process mining techniques in manufacturing. Journal of Intelligent Manufacturing, v. 1, pp.1.
Vieira, A.D., Santos, E.A.P., De Queiroz, M.H., Leal, A.B., De Paula Neto, A.D., Cury, J.E.R., 2017. A Method for PLC Implementation of Supervisory Control of Discrete Event Systems. IEEE Transactions on Control Systems Technology (Print), v. 25, pp.175-191.
Battirola Filho, J.C., Piechnicki, F., Loures, E.F.R., Santos, E.A.P., 2017. Process-aware FMEA framework for failure analysis in maintenance. Journal of Manufacturing technology Management, v. 28, pp.822-848.
Ruschel, E., Santos, E.A.P., Loures, E.A.P., 2017. Industrial maintenance decision-making: A systematic literature review. Journal of Manufacturing Systems, v. 45, pp.180-194.